Radiation Damage in Structured Silicon Semiconductor Detectors

The basic mechanisms of radiation damage in silicon detectors and their consequences on detector performance are described. This is done for two very different applications: spectroscopic imaging detectors as used in X-ray astronomy and position measuring tracking detectors which have to work in the extreme radiation environment of presently constructed particle colliders. The areas most prone to damage are identified and suggestions are given for improving the design or altering the concept. 80805 München – Föhringer Ring 6

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