Analyzing crosstalk in the presence of weak bridge defects

An extensive simulation study of various combinations of resistive bridges and crosstalk has been performed and several notable properties that have significant implications for test development have been discovered. Scenarios have been identified where a combination of a bridge at one site and a crosstalk at a separate site in its transitive fanout (or vice versa) can cause slowdown/speed-up whose magnitude significantly exceeds the sum of the slow-down/speed-up, caused by each effect in isolation. It has also been identified that a test vector generated for crosstalk may in fact be invalidated due to the presence of a weak bridge at the crosstalk site. The properties discovered, provide the motivation for a more analytical study that will eventually lead to the proposed framework for test development.

[1]  Melvin A. Breuer,et al.  Test generation for crosstalk-induced delay in integrated circuits , 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).

[2]  F. Joel Ferguson,et al.  Sandia National Labs , 2022 .

[3]  John Paul Shen,et al.  A CMOS fault extractor for inductive fault analysis , 1988, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[4]  Melvin A. Breuer,et al.  Test generation in VLSI circuits for crosstalk noise , 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).

[5]  Melvin A. Breuer,et al.  Test generation for crosstalk-induced faults: framework and computational results , 2000, Proceedings of the Ninth Asian Test Symposium.

[6]  F. Joel Ferguson,et al.  Carafe: an inductive fault analysis tool for CMOS VLSI circuits , 1993, Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium.

[7]  Melvin A. Breuer,et al.  Analytic models for crosstalk delay and pulse analysis under non-ideal inputs , 1997, Proceedings International Test Conference 1997.

[8]  Will R. Moore,et al.  Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything? , 2000, Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159).