Transverse Beam Profiling and Vertical Emittance Control with a Double-Slit Stellar Interferometer

Double-slit interferometers are useful tools to measure the transverse the cross-section of relativistic charged particle beams emitting incoherent synchrotron radiation. By rotating the double-slit about the beam propagation axis, the transverse beam profile can be reconstructed including beam tilt at the source. The interferometer can also be used as a sensitive monitor for vertical emittance control. In this paper we outline a simple derivation of the Van CittertZernike theorem, present results for a rotating double-slit measurement and demonstrate application of the interferometer to vertical emittance control using the Robust Conjugate Direction Search (RCDS) optimization algorithm.