ANALYSIS OF SYSTEMATIC AND RANDOM ERROR IN SRF MATERIAL PARAMETER CALCULATIONS

To understand the relationship between an RF cavity performance and the material on its surface, one must look at various parameters, including energy gap, mean free path, and residual resistance. Though SRIMP fits for seven parameters, three parameters are eliminated using measurement and literature values, and the uncertainty of the fit of the remaining four parameters is further reduced by synthesizing two 3-parameter fits, each from a different data set. To study random error, Monte Carlo simulations were performed of ideal data with added noise; for systematic error, contour plots of normalized residual sum of squares (RSS) of the polymorphic fit on inputted data were generated.