Tools in Metrology Torino , October 1993 AN INTRODUCTION TO SPECTRAL ANALYSIS AND WAVELETS

In metrology experimentalists often measure quantities with respect to an independent variable that is ordered such as time, depth or distance along a line. Time series analysis is the study of the statistical properties of such ordered measurements. Here we briefly introduce two important techniques in time series analysis, namely, spectral analysis and wavelet analysis, both of which can be of value in understanding metrological data.

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