The Extreme Ultraviolet and X-Ray Irradiance Sensors (EXIS) on GOES-16: Measurements, Data Products, and First Results
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Andrew R. Jones | S. Tadikonda | R. Viereck | J. Machol | W. McClintock | T. Woods | E. Thiemann | M. Snow | D. Woodraska | M. Todirita | F. Epavier | M. Anfinson | G. Comeyne