Identification of perimeter depletion and emitter plug effects in deep-submicrometer, shallow-junction polysilicon emitter bipolar transistors
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Joachim N. Burghartz | James D. Warnock | Jack Y.-C. Sun | C. L. Stanis | S. R. Mader | J. Sun | J. Burghartz | J. Warnock | S. Mader | C. Stanis
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