THz detectors based on Si-CMOS technology field effect transistors – advantages, limitations and perspectives for THz imaging and spectroscopy
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W. Knap | D. Coquillat | N. Pałka | J. Lusakowski | D. Yavorskiy | J. Marczewski | D. Tomaszewski | P. Zagrajek | P. Kopyt | K. Kucharski | C. Kolacinski | D. Obrebski | R. Ryniec