This paper describes a design system capable of designing chips in the range of 5K to 7K equivalent three-way NOR gates. A key feature of the system is the ability to design chips with large macros (RAMs and PLAs). This design system is part of IBM's corporate-wide Engineering Design System (EDS). EDS provides the capabilities of logic simulation, automatic placement and wiring, checking, and test pattern generation (I). This paper describes the key capabilities of the system, specifically as applied to IBM's silicon gate process. Topics covered include a description of the chip image and circuits, the automatic generation of large macros, the automatic placement and interconnection of circuits and macros, and a delay calculator/optimizer.
[1]
Carl R. McCaw.
Unified Shapes Checker - A Checking Tool for LSI
,
1979,
16th Design Automation Conference.
[2]
J. S. Koford,et al.
Using a graphic data-processing system to design artwork for manufacturing hybrid integrated circuits
,
1966,
AFIPS '66 (Fall).
[3]
Roy A. Wood.
A High Density Programmable Logic Array Chip
,
1979,
IEEE Transactions on Computers.
[4]
M. Correia,et al.
Design automation in IBM
,
1981
.
[5]
Robert A. Rasmussen,et al.
A view of a user-oriented production test data generation system
,
1970,
DAC '70.
[6]
William R. Heller,et al.
Prediction of wiring space requirements for LSI
,
1977,
DAC '77.