Nanopyramid: An Optical Scrambler Against Backside Probing Attacks

Optical probing from the backside of an integrated circuit (IC) is a powerful failure analysis technique but raises serious security concerns when in the hands of attackers. For instance, attacks using laser voltage probing (LVP) allow direct reading of sensitive information being stored and/or processed in the IC. Although a few sensor-based countermeasures against backside optical probing attacks have been proposed, the overheads (fabrication cost and/or area) are considerable. In this paper, we introduce nanopyramid structures that mitigate optical probing attacks by scrambling the measurements reflected by a laser pulse. Nanopyramid structure is applied to selected areas inside an IC that requires protection against optical probing attacks. The fabrication of nanopyramids is CMOS compatible and well established for photovoltaic applications. We design the nanopyramid structure in ICs, develop the LVP attacking model, and perform optical simulations to analyze the impact of nanopyramids on LVP. According to the simulation results, the nanopyramid can disturb the optical measurements enough to make LVP attacks practically infeasible. In addition, our nanopyramid countermeasure has no area overheads and works in a passive mode without consuming any energy.

[1]  Gang Chen,et al.  Efficient light trapping in inverted nanopyramid thin crystalline silicon membranes for solar cell applications. , 2012, Nano letters.

[2]  Jasper G. J. van Woudenberg,et al.  Practical Optical Fault Injection on Secure Microcontrollers , 2011, 2011 Workshop on Fault Diagnosis and Tolerance in Cryptography.

[3]  Jean-Pierre Seifert,et al.  Physical Characterization of Arbiter PUFs , 2014, IACR Cryptol. ePrint Arch..

[4]  Prathamesh G. Dhoble,et al.  Design of Positive Edge Triggered D Flip-FlopUsing 32nm CMOS Technology , 2015 .

[5]  C. Boit,et al.  From IC debug to hardware security risk: The power of backside access and optical interaction , 2016, 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

[6]  Jean-Pierre Seifert,et al.  Simple photonic emission analysis of AES , 2013, Journal of Cryptographic Engineering.

[7]  Jean-Pierre Seifert,et al.  No Place to Hide: Contactless Probing of Secret Data on FPGAs , 2016, CHES.

[8]  Christian Boit,et al.  Security Risks Posed by Modern IC Debug and Diagnosis Tools , 2013, 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography.

[9]  Sergei Skorobogatov,et al.  Semi-invasive attacks: a new approach to hardware security analysis , 2005 .

[10]  Jean-Pierre Seifert,et al.  PUFMon: Security monitoring of FPGAs using physically unclonable functions , 2017, 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS).

[11]  Alain Fave,et al.  Pyramidal texturing of silicon solar cell with TMAH chemical anisotropic etching , 2006 .

[12]  Heiko Lohrke,et al.  Visible light techniques in the FinFET era: Challenges, threats and opportunities , 2017, 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

[13]  Derek Abbott,et al.  PUF Sensor: Exploiting PUF Unreliability for Secure Wireless Sensing , 2017, IEEE Transactions on Circuits and Systems I: Regular Papers.

[14]  M. Soma,et al.  Optical charge modulation as an internal voltage probe for CMOS ICs , 1988 .

[15]  Yasuroh Iriye,et al.  Characterization of orientation-dependent etching properties of single-crystal silicon: effects of KOH concentration , 1998 .

[16]  Zheng Jiayi,et al.  Improvement of conversion efficiency of multicrystalline silicon solar cells by incorporating reactive ion etching texturing , 2014 .

[17]  Wei Zhao Predictive technology modeling for scaled CMOS , 2009 .

[18]  R. Soref,et al.  Electrooptical effects in silicon , 1987 .

[19]  G. Kino,et al.  Solid immersion microscope , 1990 .

[20]  Rudolf Schlangen,et al.  Physical Techniques for Chip-Backside IC Debug in Nanotechnologies , 2008, IEEE Design & Test of Computers.

[21]  Mario Paniccia,et al.  Novel optical probing technique for flip chip packaged microprocessors , 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).

[22]  Franco Stellari,et al.  Revealing SRAM memory content using spontaneous photon emission , 2016, 2016 IEEE 34th VLSI Test Symposium (VTS).