Test strategies for a family of complex MCMs

The development of MCM test practices from chip and board test practices is summarized. The general philosophy behind MCM test strategy selection is given. A family of complex MCMs providing computer system building blocks is described. The design features related to testability and test coverage are detailed. Then, test strategies developed for each MCM are related, with emphasis on the improvements in fault coverage and diagnostic resolution provided by attention to design-for-testability.

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