Test Equipment for DAC's Performance Assessment: Design and Characterization

In this paper, the authors present a new practicable method and the related measurement station for digital-to-analog converters (DAC) characterization. The method relies on the accurate reconstruction of a sine-wave test signal generated by the DAC under test based on the simultaneous acquisitions of the signal attained by filtering the DAC output and the difference between the DAC output and the filter output. Thus, due to straightforward data processing, the signal generated by the DAC is gained with a resolution much better than the resolution (usually poor) of the analog-to-digital converter (ADC) exploited for the acquisition. The main feature of the method is the ease of implementation that requires only traditional electronics and actual measurement instrumentation. In this paper, the authors also suggest simple rules aimed at evaluating the resolution achievable by each guessed measurement station. To confirm the expected encouraging outcomes, experimental results obtained through a measurement station implemented by using a two-channel 8-bit digital scope and based on the presented method are discussed. In particular, signals generated by 12- and 14-bit DACs have been acquired and processed with the measurement station and reconstructed, with a resolution greater than 17 equivalent bits, due to the proposed method.

[1]  Degang Chen,et al.  Testing of Precision DAC Using Low-Resolution ADC With Wobbling , 2008, IEEE Transactions on Instrumentation and Measurement.

[2]  Sergio Rapuano,et al.  Digital to Analog converters: a metrological overview , 2004 .

[3]  D. Grimaldi,et al.  Static Characterization of High Resolution DAC Based on Over Sampling and Low Resolution ADC , 2007, 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007.

[4]  Yves Rolain,et al.  Static nonlinearity testing of digital-to-analog converters , 2001, IEEE Trans. Instrum. Meas..

[5]  S. Max Optimum DAC and ADC Testing , 2008, 2008 IEEE Instrumentation and Measurement Technology Conference.

[6]  Leopoldo Angrisani,et al.  Fast Transformation for DAC Parameters Identification , 2005, 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings.

[7]  Degang Chen,et al.  A two-step DDEM ADC for accurate and cost-effective DAC testing , 2005, 2005 IEEE International Symposium on Circuits and Systems.

[8]  Michele Vadursi,et al.  Design of a test equipment for DAC's performance assessment , 2009, 2009 IEEE Instrumentation and Measurement Technology Conference.

[9]  Fang Xu Signal Cancellation Technique for Testing High-end Digital-to-Analog Converters , 2007, 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007.

[10]  L. Angrisani,et al.  Modeling timing jitter effects in digital-to-analog converters , 2005 .

[11]  Chun Wei Lin,et al.  A new approach for nonlinearity test of high speed DAC , 2008, 2008 IEEE 14th International Mixed-Signals, Sensors, and Systems Test Workshop.