RF-BIST: loopback spectral signature analysis

Built-in self-test (BIST) becomes important also for more complex structures like complete front-ends. In order to bring down the costs for the test overhead, spectral signature analysis at system level seems to be a promising concept. Investigations that have been carried out are targeted on the most challenging problems: generation of the test signature, evaluation of the signature response, implementation of the concept and verification by simulation. From investigations, it can be concluded that the concept is suitable, especially in the case of transceiver-type DUT.

[1]  Gordon W. Roberts,et al.  A stand-alone integrated test core for time and frequency domain measurements , 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).

[2]  Ramjee Prasad,et al.  OFDM for Wireless Multimedia Communications , 1999 .

[3]  Abhijit Chatterjee,et al.  A signature test framework for rapid production testing of RF circuits , 2002, Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition.

[4]  Kwang-Ting Cheng,et al.  A BIST scheme for on-chip ADC and DAC testing , 2000, DATE '00.

[5]  Matthew Mahoney,et al.  DSP-Based Testing of Analog and Mixed-Signal Circuits , 1987 .

[6]  Jean-Louis Carbonero,et al.  A New Loopback GSM/DCS Bit Error Rate Test Method On Baseband I/Q Outputs , 2001, 57th ARFTG Conference Digest.

[7]  Gordon W. Roberts,et al.  Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits , 1995 .

[8]  Chung-Yi Lee,et al.  MEASUREMENT OF NOISE FIGURE, G/T, AND Ea,, USING RSSI , 1999 .

[9]  Gordon W. Roberts,et al.  A stand-alone integrated excitation/extraction system for analog BIST applications , 2000, Proceedings of the IEEE 2000 Custom Integrated Circuits Conference (Cat. No.00CH37044).

[10]  Vishwani D. Agrawal,et al.  Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits [Book Review] , 2000, IEEE Circuits and Devices Magazine.

[11]  M.A. Al-Qutayri.  System level testing of analog functions in a mixed-signal circuit , 2000, ICECS 2000. 7th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.00EX445).