论文信息 - Combined Application of Section and Projection Topography to Defect Analysis in PVT-Grown 4H-SiC - 字舞流文

Combined Application of Section and Projection Topography to Defect Analysis in PVT-Grown 4H-SiC

M. Loboda | G. Chung | M. Dudley | B. Raghothamachar | D. Hansen | S. Mueller | E. Sanchez | S. Byrappa | F. Wu | S. Shun | Huanhuan Wang