Analysis and prospect of local variability of drain current in scaled MOSFETs by a new decomposition method
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A. Kumar | T. Hiramoto | S. Inaba | S. Kamohara | A. Nishida | T. Mogami | T. Tsunomura | K. Terada | T. Mizutani | K. Takeuchi | C. Lee
[1] V. Macary,et al. Current mismatch due to local dopant fluctuations in MOSFET channel , 2003 .