Electrical profiling of arsenic-implanted HgCdTe films performed with discrete mobility spectrum analysis
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V. G. Remesnik | I. Izhnin | O. I. Fitsych | K. Mynbaev | M. Yakushev | D. Marin | V. Varavin | N. Mikhailov | I. Syvorotka | S. Dvoretsky | A. Korotaev | A. V. Voitsekhovsky