Resonant Raman scattering as a source of increased background in synchrotron excited X-ray fluorescence.

Experiments that study the optimization of tunable monochromatic synchrotron radiation for X-ray fluorescence analysis have demonstrated the importance of resonant Raman X-ray scattering in establishing the minimum detectable limit for certain types of trace analysis. These analyses involve the measurement of elements with atomic numbers less than the predominant matrix elements in which the fluorescence of the matrix components is eliminated by selecting excitation energies immediately below major absorption edges. The cross section for Raman scattering from the matrix atoms can be resonantly enhanced resulting in a significant increase in continuum background below the fluorescence peaks of elements of interest. Significant increases in minimum detectable limits have been observed for gallium arsenide samples.

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