论文信息 - On the Conversion Between Recombination Rates and Electronic Defect Parameters in Semiconductors - 字舞流文

On the Conversion Between Recombination Rates and Electronic Defect Parameters in Semiconductors

M. Schubert | Chang Sun | F. Rougieux | T. Niewelt | M. Juhl | G. Coletti | F. Heinz | J. Krich | M. V. Contreras