Partial scan design methods based on internally balanced structure

In this paper, we theoretically and experimentally show the effectiveness of partial scan design based on internally balanced structure, which is a sequential circuit capable of generating tests with a combinational test generation algorithm. Moreover, we introduce a method of extended partial scan design, which replaces part of not only flip-flops by scan flip-flops but also wires by bypass flip-flops in a sequential circuit, and propose a method of extended partial scan design based on internally balanced structure. Experimental results for benchmark circuits show that the proposed partial scan design and extended partial scan design can be implemented with low area overhead.

[1]  S.M. Reddy,et al.  On determining scan flip-flops in partial-scan designs , 1990, 1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers.

[2]  Melvin A. Breuer,et al.  Testability properties of acyclic structures and applications to partial scan design , 1992, Digest of Papers. 1992 IEEE VLSI Test Symposium.

[3]  Srimat T. Chakradhar,et al.  Sequential circuits with combinational test generation complexity , 1996, Proceedings of 9th International Conference on VLSI Design.

[4]  Dinesh Bhatia,et al.  Pseudoexhaustive BIST for sequential circuits , 1993, Proceedings of 1993 IEEE International Conference on Computer Design ICCD'93.

[5]  Hans-Joachim Wunderlich,et al.  The pseudoexhaustive test of sequential circuits , 1989, Proceedings. 'Meeting the Tests of Time'., International Test Conference.

[6]  Francky Catthoor,et al.  Partial scan and symbolic test at the register-transfer level , 1995, J. Electron. Test..

[7]  Tomoo Inoue,et al.  Partial scan design methods based on internally balanced structure , 1998 .

[8]  Melvin A. Breuer,et al.  The BALLAST Methodology for Structured Partial Scan Design , 1990, IEEE Trans. Computers.

[9]  Vishwani D. Agrawal,et al.  An exact algorithm for selecting partial scan flip-flops , 1995, J. Electron. Test..

[10]  Hideo Fujiwara,et al.  A sequential circuit structure with combinational test generation complexity and its application , 1997, Systems and Computers in Japan.

[11]  藤原 秀雄,et al.  Logic testing and design for testability , 1985 .

[12]  K.-T. Cheng,et al.  A Partial Scan Method for Sequential Circuits with Feedback , 1990, IEEE Trans. Computers.