论文信息 - Characterization of buried interfaces using Ga Kα hard X-ray photoelectron spectroscopy (HAXPES). - 字舞流文

Characterization of buried interfaces using Ga Kα hard X-ray photoelectron spectroscopy (HAXPES).

B. Spencer | D. Binks | R. Oliver | T. Thomson | W. Flavell | A. Jones | M. Kappers | A. Thomas | A. Shard | A. Theodosiou | D. Cant | P. Thompson | S. Maniyarasu | S. Church | J. Higgins