Modeling Power Supply Noise in Delay Testing

Excessive power supply noise during test can cause overkill. This article discusses two models for supply noise in delay testing and their application to test compaction. The proposed noise models avoid complicated power network analysis, making them much faster than existing power noise analysis tools. can cause performance degradation and

[1]  Susmita Sur-Kolay,et al.  A modeling approach for addressing power supply switching noise related failures of integrated circuits , 2004, Proceedings Design, Automation and Test in Europe Conference and Exhibition.

[2]  Weiping Shi,et al.  K longest paths per gate (KLPG) test generation for scan-based sequential circuits , 2004, 2004 International Conferce on Test.

[3]  Jing Wang,et al.  A vector-based approach for power supply noise analysis in test compaction , 2005, IEEE International Conference on Test, 2005..

[4]  Kwang-Ting Cheng,et al.  Pattern generation for delay testing and dynamic timing analysisconsidering power-supply noise effects , 2001, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[5]  Farid N. Najm,et al.  Timing Analysis in Presence of Power Supply and Ground Voltage Variations , 2003, ICCAD 2003.

[6]  Kenneth M. Butler,et al.  A case study of ir-drop in structured at-speed testing , 2003, International Test Conference, 2003. Proceedings. ITC 2003..

[7]  Ananta K. Majhi,et al.  On hazard-free patterns for fine-delay fault testing , 2004 .

[8]  Rajendran Panda,et al.  Vectorless Analysis of Supply Noise Induced Delay Variation , 2003, ICCAD 2003.

[9]  Kenneth L. Shepard,et al.  Noise in deep submicron digital design , 1996, Proceedings of International Conference on Computer Aided Design.

[10]  Guido Gronthoud,et al.  Power Supply Noise in Delay Testing , 2006, 2006 IEEE International Test Conference.

[11]  C. P. Ravikumar,et al.  Static Verification of Test Vectors for IR Drop Failure , 2003, ICCAD 2003.

[12]  Kwang-Ting Cheng,et al.  Analysis of performance impact caused by power supply noise in deep submicron devices , 1999, DAC '99.