Calibration, properties, and applications of the division-of-amplitude photopolarimeter at 632.8 and 1523 nm
暂无分享,去创建一个
[1] R. Hauge,et al. Ellipsometric method for the measurement of temperature and optical constants of incandescent transition metals. , 1989, Applied optics.
[2] Rasheed M. A. Azzam,et al. Accurate calibration of the four-detector photopolarimeter with imperfect polarizing optical elements , 1989 .
[3] D. Aspnes. Optical properties of thin films , 1982 .
[4] Rasheed M. A. Azzam,et al. Construction, calibration, and testing of a four‐detector photopolarimeter , 1988 .
[6] R. M. A. Azzam,et al. Division-of-amplitude Photopolarimeter (DOAP) for the Simultaneous Measurement of All Four Stokes Parameters of Light , 1982 .
[7] Rasheed M. A. Azzam,et al. General analysis and optimization of the four- detector photopolarimeter , 1988 .
[8] K. Brudzewski. Static Stokes Ellipsometer: General Analysis and Optimization , 1991 .
[9] Paul C. Nordine,et al. Refractive Index of Liquid Aluminum Oxide at 0.6328 μm , 1991 .
[10] R. Azzam,et al. Arrangement of four photodetectors for measuring the state of polarization of light. , 1985, Optics letters.
[11] P. S. Hauge. Recent developments in instrumentation in ellipsometry , 1980 .
[12] P. S. Hauge,et al. Mueller matrix ellipsometry with imperfect compensators , 1978 .
[14] R. Azzam,et al. Equalization of the Complex Reflection Coefficients for the Parallel and Perpendicular Polarizations of an Absorbing Substrate Coated by a Transparent Thin Film , 1985 .
[15] K. Vedam,et al. Characterization of real surfaces by ellipsometry , 1972 .