An On-line Variable Speed Scanning Method with Machine Learning Based Feedforward Control for Atomic Force Microscopy
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[1] Chris Manzie,et al. Extremum-seeking-based adaptive scan for atomic force microscopy , 2017, 2017 IEEE 56th Annual Conference on Decision and Control (CDC).
[2] S O R Moheimani,et al. High-speed cycloid-scan atomic force microscopy , 2010, Nanotechnology.
[3] Carl E. Rasmussen,et al. Gaussian processes for machine learning , 2005, Adaptive computation and machine learning.
[4] S O Reza Moheimani,et al. High-speed Lissajous-scan atomic force microscopy: scan pattern planning and control design issues. , 2012, The Review of scientific instruments.
[5] Gerber,et al. Atomic Force Microscope , 2020, Definitions.
[6] Yongchun Fang,et al. Note: A novel atomic force microscope fast imaging approach: variable-speed scanning. , 2011, The Review of scientific instruments.
[7] Rolf Findeisen,et al. Two-degree-of-freedom control combining machine learning and extremum seeking for fast scanning quantum dot microscopy , 2018, 2018 Annual American Control Conference (ACC).
[8] Han Lu,et al. An on-line scanning time allocation based variable speed scanning method for atomic force microscopies , 2015, 2015 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO).
[9] A. Bazaei,et al. Combining Spiral Scanning and Internal Model Control for Sequential AFM Imaging at Video Rate , 2017, IEEE/ASME Transactions on Mechatronics.
[10] Ahmad Ahmad,et al. Adaptive AFM scan speed control for high aspect ratio fast structure tracking. , 2014, The Review of scientific instruments.
[11] Qingze Zou,et al. Adaptive-scanning, near-minimum-deformation atomic force microscope imaging of soft sample in liquid: Live mammalian cell example? , 2016, 2016 American Control Conference (ACC).
[12] Li-Chen Fu,et al. Precision Sinusoidal Local Scan for Large-Range Atomic Force Microscopy With Auxiliary Optical Microscopy , 2015, IEEE/ASME Transactions on Mechatronics.
[13] Paul K. Hansma,et al. Fast imaging and fast force spectroscopy of single biopolymers with a new atomic force microscope designed for small cantilevers , 1999 .
[14] Bharath Bhikkaji,et al. A New Scanning Method for Fast Atomic Force Microscopy , 2011, IEEE Transactions on Nanotechnology.
[15] Kamal Youcef-Toumi,et al. On automating atomic force microscopes: An adaptive control approach , 2007 .
[16] Karl Johan Åström,et al. Design and Modeling of a High-Speed AFM-Scanner , 2007, IEEE Transactions on Control Systems Technology.
[17] L. Fu,et al. Lissajous Hierarchical Local Scanning to Increase the Speed of Atomic Force Microscopy , 2015, IEEE Transactions on Nanotechnology.
[18] Ming-Li Chiang,et al. Design of a High-speed and High-precision Hybrid Scanner with a New Path Planning Strategy Based on Spatial Entropy , 2018, 2018 Annual American Control Conference (ACC).
[19] Zhaojing Wu,et al. Robust adaptive output-feedback controller design for stochastic nonlinear systems , 2010, 2010 Chinese Control and Decision Conference.