Hochauflösende Topometrie im Kontext globaler Makrostrukturen / High Resolution Topometry in Conjunction with Macro Structures
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A. Duparre | S. Gliech | G. Notni | R.-J. Recknagel | Τ. Feigl | S. Gliech | A. Duparré | G. Notni | R. Recknagel | Τ. Feigl
[1] Horst Truckenbrodt,et al. Microtopography investigations of optical surfaces and thin films by light scattering, optical profilometry, and atomic-force microscopy , 1993, Optics & Photonics.
[2] H Truckenbrodt,et al. Interfacial roughness and related scatter in ultraviolet optical coatings: a systematic experimental approach. , 1998, Applied optics.
[3] Angela Duparre,et al. Quality assessment of supersmooth to rough surfaces by multiple-wavelength light scattering measurement , 1997, Optics & Photonics.
[4] C. Ruppe,et al. Roughness analysis of optical films and substrates by atomic force microscopy , 1996 .
[5] Gunther Notni,et al. Analysis of white light interferograms using wavelet methods , 1998 .
[6] Gunther Notni,et al. Measurement and analysis of microtopography using wavelet methods , 1997, Other Conferences.