Emulation of an ASIC power and temperature monitoring system (eTPMon) for FPGA prototyping
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Ulf Schlichtmann | Doris Schmitt-Landsiedel | Elisabeth Glocker | Qingqing Chen | Ulf Schlichtmann | D. Schmitt-Landsiedel | E. Glocker | Qingqing Chen
[1] Sanjay Ranka,et al. A simple thermal model for multi-core processors and its application to slack allocation , 2010, 2010 IEEE International Symposium on Parallel & Distributed Processing (IPDPS).
[2] O. Semenov,et al. Impact of self-heating effect on long-term reliability and performance degradation in CMOS circuits , 2006, IEEE Transactions on Device and Materials Reliability.
[3] Jürgen Teich,et al. Invasive Computing: An Overview , 2011, Multiprocessor System-on-Chip.
[4] T. Grasser,et al. The time dependent defect spectroscopy (TDDS) for the characterization of the bias temperature instability , 2010, 2010 IEEE International Reliability Physics Symposium.
[5] Sandro Penolazzi,et al. A System-Level Framework for Energy and Performance Estimation in System-on-Chip Architectures , 2011 .
[6] Doris Schmitt-Landsiedel,et al. Reliability monitoring of digital circuits by in situ timing measurement , 2013, 2013 23rd International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS).
[7] Chenyue Ma,et al. Accurate description of temperature accelerated NBTI effect using the universal prediction model , 2015, 2015 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC).
[8] Doris Schmitt-Landsiedel,et al. A method to analyze the impact of fast-recovering NBTI degradation on the stability of large-scale SRAM arrays , 2011 .
[9] Bin Zhang. Online circuit reliability monitoring , 2009, GLSVLSI '09.
[10] Ben Klass. Modeling Inter-Instruction Energy Effects in a Digital Signal Processor , 2006 .
[11] Ulf Schlichtmann,et al. Workload- and instruction-aware timing analysis - The missing link between technology and system-level resilience , 2014, 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC).
[12] Doris Schmitt-Landsiedel,et al. From an analytic NBTI device model to reliability assessment of complex digital circuits , 2014, 2014 IEEE 20th International On-Line Testing Symposium (IOLTS).
[13] Stephen H. Gunther,et al. Managing the Impact of Increasing Microprocessor Power Consumption , 2001 .
[14] Kevin Skadron,et al. Compact thermal modeling for temperature-aware design , 2004, Proceedings. 41st Design Automation Conference, 2004..
[15] Luca Benini,et al. Thermal and Energy Management of High-Performance Multicores: Distributed and Self-Calibrating Model-Predictive Controller , 2013, IEEE Transactions on Parallel and Distributed Systems.
[16] Luca Benini,et al. A fast HW/SW FPGA-based thermal emulation framework for multi-processor system-on-chip , 2006, 2006 43rd ACM/IEEE Design Automation Conference.
[17] Doris Schmitt-Landsiedel,et al. Countermeasures against NBTI degradation on 6T-SRAM cells , 2011 .
[18] Li Shang,et al. Power, Thermal, and Reliability Modeling in Nanometer-Scale Microprocessors , 2007, IEEE Micro.
[19] T. Grasser,et al. Evidence That Two Tightly Coupled Mechanisms Are Responsible for Negative Bias Temperature Instability in Oxynitride MOSFETs , 2009, IEEE Transactions on Electron Devices.
[20] Kevin Skadron,et al. Temperature-aware microarchitecture: Modeling and implementation , 2004, TACO.
[21] Robert F. Boehm,et al. Conduction Heat Transfer , 2017 .
[22] Andreas Herkersdorf,et al. Hardware assisted thread assignment for RISC based MPSoCs in invasive computing , 2011, 2011 International Symposium on Integrated Circuits.
[23] Dimitrios Soudris,et al. A Systematic Methodology for Reliability Improvements on SoC-Based Software Defined Radio Systems , 2012, VLSI Design.
[24] Doris Schmitt-Landsiedel,et al. Modeling of temperature scenarios in a multicore processor system , 2013 .
[25] Ulf Schlichtmann,et al. Efficiently analyzing the impact of aging effects on large integrated circuits , 2012, Microelectron. Reliab..
[26] Hao Shen,et al. An FPGA-Based Distributed Computing System with Power and Thermal Management Capabilities , 2011, 2011 Proceedings of 20th International Conference on Computer Communications and Networks (ICCCN).
[27] T. Grasser,et al. The statistical analysis of individual defects constituting NBTI and its implications for modeling DC- and AC-stress , 2010, 2010 IEEE International Reliability Physics Symposium.
[28] Srivaths Ravi,et al. Power emulation: a new paradigm for power estimation , 2005, Proceedings. 42nd Design Automation Conference, 2005..
[29] Margaret Martonosi,et al. Full-system chip multiprocessor power evaluations using FPGA-based emulation , 2008, Proceeding of the 13th international symposium on Low power electronics and design (ISLPED '08).
[30] Ulf Schlichtmann,et al. A compact model for NBTI degradation and recovery under use-profile variations and its application to aging analysis of digital integrated circuits , 2014, Microelectron. Reliab..