The Analysis Of Accuracy Of Selected Methods Of Measuring The Thermal Resistance Of IGBTs

In the paper selected methods of measuring the thermal resistance of an IGBT (Insulated Gate Bipolar Transistor) are presented and the accuracy of these methods is analysed. The analysis of the measurement error is performed and operating conditions of the considered device, at which each measurement method assures the least measuring error, are pointed out. Theoretical considerations are illustrated with some results of measurements and calculations.

[1]  Jasprit Singh.  Semiconductor Devices: Basic Principles , 2000 .

[2]  Krzysztof Gorecki,et al.  DC measurements method of the thermal resistance of power MOSFETs , 2012, Proceedings of the 19th International Conference Mixed Design of Integrated Circuits and Systems - MIXDES 2012.

[3]  J Zarȩbski,et al.  A Semiconductor Device Thermal Model Taking into Account Non-linearity and Multhipathing of the Cooling System , 2014 .

[4]  Pawel Górecki,et al.  The dc measurement method of thermal resistance of IGBTs , 2013, Proceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems - MIXDES 2013.

[5]  Janusz Zarebski,et al.  Modeling the Influence of Selected Factors on Thermal Resistance of Semiconductor Devices , 2014, IEEE Transactions on Components, Packaging and Manufacturing Technology.

[6]  David L. Blackburn,et al.  Semiconductor measurement technology: Thermal resistance measurements , 1990 .

[7]  Krzysztof Górecki,et al.  A method of the thermal resistance measurements of semiconductor devices with p–n junction , 2008 .

[8]  V. Székely,et al.  A new evaluation method of thermal transient measurement results , 1997 .

[9]  A. Castellazzi,et al.  Reliability analysis and modeling of power MOSFETs in the 42-V-PowerNet , 2006, IEEE Transactions on Power Electronics.

[10]  K. Górecki,et al.  Nonlinear Compact Thermal Model of Power Semiconductor Devices , 2010, IEEE Transactions on Components and Packaging Technologies.

[11]  K. Górecki,et al.  Measurements of thermal resistance of solar cells , 2014 .

[12]  D. Kinzer,et al.  The semiconductor roadmap for power management in the new millennium , 2001, Proc. IEEE.

[13]  Janusz Zarebski,et al.  A New Measuring Method of the Thermal Resistance of Silicon p-n Diodes , 2007, IEEE Transactions on Instrumentation and Measurement.

[14]  T. Martin,et al.  Thermal Properties and Reliability of GaN Microelectronics: Sub-Micron Spatial and Nanosecond Time Resolution Thermography , 2007, 2007 IEEE Compound Semiconductor Integrated Circuits Symposium.

[15]  Janusz Zarebski,et al.  The Electrothermal Large-Signal Model of Power MOS Transistors for SPICE , 2010, IEEE Transactions on Power Electronics.

[16]  Li Ran,et al.  Improved Electrothermal Ruggedness in SiC MOSFETs Compared With Silicon IGBTs , 2014, IEEE Transactions on Electron Devices.

[17]  Robert W. Erickson,et al.  Fundamentals of Power Electronics , 2001 .

[18]  James L. Taylor,et al.  Metrology : Calibration and Measurement Processes Guidelines , 1994 .

[19]  Pawel Górecki,et al.  Modelling the influence of self-heating on characteristics of IGBTs , 2014, 2014 Proceedings of the 21st International Conference Mixed Design of Integrated Circuits and Systems (MIXDES).

[20]  Noel Y. A. Shammas,et al.  Thermoelectric cooling of microelectronic circuits and waste heat electrical power generation in a desktop personal computer , 2011 .

[21]  Bernard Courtois,et al.  Thermal investigations of ICs and microstructures , 1998 .

[22]  Dong Liu,et al.  On-Chip Thermal Management With Microchannel Heat Sinks and Integrated Micropumps , 2006, Proceedings of the IEEE.

[23]  D. Blackburn.  Temperature measurements of semiconductor devices - a review , 2004, Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545).

[24]  Andrzej Kos,et al.  INVESTIGATION OF HEAT TRANSFER IN INTEGRATED CIRCUITS , 2014 .

[25]  Janusz Zarebski,et al.  A New Method for the Measurement of the Thermal Resistance of the Monolithic Switched Regulator LT1073 , 2007, IEEE Transactions on Instrumentation and Measurement.