A prognostic approach for systems subject to wiener degradation process with cumulative-type random shocks

Condition monitoring data have been widely used to evaluate the health state and reliability, as well as estimate the remaining useful life (RUL) for degrading systems. Among various degradation modeling and RUL estimating methods, Wiener process based models is recognized by both scholars and engineers as the one of the most effect tools, and thus becomes very popular nowadays. In this paper, a prognostic approach is developed for degrading systems whose performance evolution is captured by an integration of Wiener process and cumulative-type of random shocks depicted by a compound Poisson pro-cess. Under the concept of first hitting time, an approximate lifetime distribution in analytical form, which greatly reduces the computing time while proving an adequately accurate result, has been formulated. The parameter estimation framework based expectation maximization (EM) algorithm has been derived. Simulations and cases study of the degradation of Li-ion batteries are executed to illustrate and validate the proposed method. The results demonstrate that the approach in this paper can not only handle the positive shocks but also process the negative shocks, which outperforms most of the existing models.

[1]  Min Xie,et al.  Stochastic modelling and analysis of degradation for highly reliable products , 2015 .

[2]  Qianmei Feng,et al.  Reliability analysis of multiple-component series systems subject to hard and soft failures with dependent shock effects , 2016 .

[3]  Kwok-Leung Tsui,et al.  Condition monitoring and remaining useful life prediction using degradation signals: revisited , 2013 .

[4]  Hoang Pham,et al.  Reliability modeling of multi-state degraded systems with multi-competing failures and random shocks , 2005, IEEE Trans. Reliab..

[5]  Hong-Zhong Huang,et al.  An Approach to Reliability Assessment Under Degradation and Shock Process , 2011, IEEE Transactions on Reliability.

[6]  Jeffrey P. Kharoufeh,et al.  Explicit results for wear processes in a Markovian environment , 2003, Oper. Res. Lett..

[7]  Donghua Zhou,et al.  A Generalized Result for Degradation Model-Based Reliability Estimation , 2014, IEEE Trans Autom. Sci. Eng..

[8]  Nan Chen,et al.  The Inverse Gaussian Process as a Degradation Model , 2014, Technometrics.

[9]  Qianmei Feng,et al.  Reliability modeling for dependent competing failure processes with changing degradation rate , 2014 .

[10]  XieMin,et al.  Stochastic modelling and analysis of degradation for highly reliable products , 2015 .

[11]  M.G. Pecht,et al.  Prognostics and health management of electronics , 2008, IEEE Transactions on Components and Packaging Technologies.

[12]  D. Rubin,et al.  Maximum likelihood from incomplete data via the EM - algorithm plus discussions on the paper , 1977 .

[13]  Narayanaswamy Balakrishnan,et al.  Optimal Design for Degradation Tests Based on Gamma Processes With Random Effects , 2012, IEEE Transactions on Reliability.

[14]  Jay Lee,et al.  A review on prognostics and health monitoring of Li-ion battery , 2011 .