High-resolution photoelectron spectroscopy of Ge-based HfO2 gate stacks
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Olivier Renault | Laurent Clavelier | E. Martinez | L. Clavelier | E. Martinez | O. Renault | N. Barrett | C. Leroyer | C. Crotti | L. Fourdrinier | C. Leroyer | Nicholas Barrett | C. Crotti | L. Fourdrinier
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