Method for Correcting tilt of 3D shape measuring device

The present invention relates to a method for correcting a tilt of a three-dimensional shape-measuring device which is performed by the three-dimensional shape-measuring device which measures a three-dimensional shape of an object to be inspected by using a reflected pattern image after irradiating the object to be inspected with pattern lighting by using a plurality of projectors. The method for correcting a tilt of a three-dimensional shape measuring device comprises the following steps: obtaining at least one first pattern image having a first phase value and at least one second pattern image having a second phase value; extracting a line of a pattern by executing a conversion algorithm for detecting a line by performing image processing with respect to the first pattern image and the second pattern image; and extracting pattern angles of the first pattern image and the second pattern image by using the line of the pattern and then outputting a tilt adjustment value for the projector by using the pattern angles. Accordingly, a tilt angle of a component is corrected by outputting a tilt adjustment value of the component by using an inclination angle of a pattern on a pattern image or a zero crossing point of a strength profile of the pattern image. Therefore, a measurement error, which may occur depending on a tilted angle or an installation location of a component, can be precisely corrected. Consequently, the degree of precision for measuring a three-dimensional shape can be increased, and a component can be assembled or set to make spatial frequencies of patterns on a pattern image be the same or similar.