Experimental Investigation of SELs in SiT8003 MEMS-Oscillators
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Dmitry V. Boychenko | Alexander A. Pechenkin | Andrey V. Yanenko | Alexander S. Tararaksin | Leonid N. Kessarinskiy | Alexandra V. Demidova | Alexander Y. Nikiforov | A. V. Demidova | D. Boychenko | A. Nikiforov | L. Kessarinskiy | A. Pechenkin | A. Tararaksin | A. Yanenko
[1] Clive Dyer,et al. Comparison between SRAM SEE cross-sections from ion beam testing with those obtained using a new picosecond pulsed laser facility , 1999, 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471).
[2] P. Skorobogatov. Laser imitation simulation behind the diffraction limit , 2014 .
[3] Michael Nicolaidis,et al. Soft Errors in Modern Electronic Systems , 2010 .
[4] Andrey A. Antonov,et al. Design of 65 nm CMOS SRAM for space applications: A comparative study , 2014, 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
[5] V. A. Telets,et al. IC space radiation effects experimental simulation and estimation methods , 1999 .
[6] Raoul Velazco,et al. Integrated Circuit Qualification for Space and Ground-Level Applications: Accelerated Tests and Error-Rate Predictions , 2011 .
[7] A. S. Tararaksin,et al. Single-event-effect sensetivity characterization of LSI circuits with a laser-based and a pulsed gamma-ray testing facilities used in combination , 2012 .
[8] Clive Dyer,et al. Comparison between SRAM SEE cross-sections from ion beam testing with those obtained using a new picosecond pulsed laser facility , 1999 .
[9] A. Yu Nikiforov,et al. Development perspectives for radiation-hard shf transmit/receive LSI's for applications of SOI CMOS technology , 2014, 2014 24th International Crimean Conference Microwave & Telecommunication Technology.
[12] Laser simulation of volume ionization effects in submicron VLSI circuits , 2013 .
[13] Lloyd W. Massengill,et al. Transient Radiation Upset Simulations of CMOS Memory Circuits , 1984, IEEE Transactions on Nuclear Science.
[14] I. V. Kalagin,et al. High Energy (20-60 AMeV) Ion Beam-Line for SEE Testing at U400M FLNR JINR Cyclotron , 2015, 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
[16] O. A. Kalashnikov,et al. An estimate of the FPGA sensitivity to effects of single nuclear particles , 2012 .
[17] Dean Lewis,et al. Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing , 2007 .
[18] Alexander A. Pechenkin,et al. Local laser irradiation technique for SEE testing of ICs , 2011, 2011 12th European Conference on Radiation and Its Effects on Components and Systems.
[19] S. P. Buchner,et al. Laboratory tests for single-event effects , 1996 .
[20] A. N. Egorov,et al. Single event latchup threshold estimation based on laser dose rate test results , 1997 .
[21] G. C. Messenger,et al. Single Event Phenomena , 1997 .