Notes on Multiple Input Signature Analysis

Many results regarding the probability of aliasing for multiple-input compactors have been derived under error assumptions that are not very realistic for VLSI circuits. Recently, the value of aliasing probability has been proven to tend to 2/sup -k/, where k is the number of binary memory elements of the linear compactor. This result is based on the assumption that the compactor is characterized by an irreducible polynomial and that the 'no error' vector has a probability different from zero. In these notes, the above result is generalized. More specifically, it is proved that it is valid if any two error vectors, neither of which needs to be the 'no error' vector, have probabilities of occurrence different from zero. To make the error model complete, the situation in which exactly one error vector has a probability different from zero is also considered. For the latter type of error distributions, the test lengths at which aliasing occurs are determined. Simple proofs for the results are provided; they are based on standard linear algebra notions and well-known theorems. >

[1]  Howard C. Card,et al.  Cellular automata-based pseudorandom number generators for built-in self-test , 1989, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[2]  W. Daehn,et al.  Aliasing errors in multiple input signature analysis registers , 1989, [1989] Proceedings of the 1st European Test Conference.

[3]  René David Comments on "Signature Analysis for Multiple Output Circuits" , 1990, IEEE Trans. Computers.

[4]  T. Williams,et al.  Aliasing errors in linear automata used as multiple-input signature analyzers , 1990 .

[5]  Edward J. McCluskey,et al.  Hybrid designs generating maximum-length sequences , 1988, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[6]  W. Nef Linear Algebra , 1967 .

[7]  A. Hlawiczka Hybrid design of parallel signature analyzers , 1989, [1989] Proceedings of the 1st European Test Conference.

[8]  Theo J. Powell,et al.  Analysis and Simulation of Parallel Signature Analyzers , 1987, ITC.

[9]  Dhiraj K. Pradhan,et al.  Aliasing Probability for Multiple Input Signature Analyzer , 1990, IEEE Trans. Computers.

[10]  Piero Olivo,et al.  Analysis and Design of Linear Finite State Machines for Signature Analysis Testing , 1991, IEEE Trans. Computers.

[11]  Nirmal R. Saxena,et al.  Simultaneous signature and syndrome compression , 1988, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[12]  William Feller,et al.  An Introduction to Probability Theory and Its Applications , 1951 .

[13]  Edward J. McCluskey,et al.  Logic design principles - with emphasis on testable semicustom circuits , 1986, Prentice Hall series in computer engineering.

[14]  K. Iwasaki,et al.  An analysis of the aliasing probability of multiple-input signature registers in the case of a 2m-ary symmetric channel , 1990, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[15]  Michele Favalli,et al.  Aliasing in signature analysis testing with multiple input shift registers , 1990, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[16]  C. C. MacDuffee,et al.  Vectors and matrices , 1943 .

[17]  W. W. Peterson,et al.  Error-Correcting Codes. , 1962 .

[18]  Wilfried Daehn,et al.  Comparison of Aliasing Errors for Primitive and Non-Primitive Polynomials , 1986, ITC.

[19]  T. W. Williams,et al.  Aliasing probability for multiple input signature analyzers with dependent inputs , 1989, Proceedings. VLSI and Computer Peripherals. COMPEURO 89.

[20]  Jacob Savir,et al.  Built In Test for VLSI: Pseudorandom Techniques , 1987 .

[21]  Hideo Fujiwara,et al.  Logic Testing and Design for Testability , 1985 .