Non-invasive timing analysis of IBM G6 microprocessor L1 cache using backside time-resolved hot electron luminescence

Picosecond imaging circuit analysis (PICA) is recently demonstrated to be a practical measurement technique of internal timing of ICs. This paper describes application of PICA to analysis of individual MOSFET switching times in the L1 cache write control circuits of the S/390 G6 microprocessor chip.

[1]  David P. Vallett,et al.  Picosecond imaging circuit analysis , 1998, IBM J. Res. Dev..

[2]  J.A. Kash,et al.  Picosecond imaging circuit analysis of the POWER3 clock distribution , 1999, 1999 IEEE International Solid-State Circuits Conference. Digest of Technical Papers. ISSCC. First Edition (Cat. No.99CH36278).

[3]  Pia Sanda,et al.  Non-invasive timing analysis of IBM G6 microprocessor L1 cache using picosecond imaging circuit analysis , 2000, Proceedings of the Ninth Asian Test Symposium.

[4]  Leendert M. Huisman,et al.  Diagnosis and characterization of timing-related defects by time-dependent light emission , 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).

[5]  Pia Sanda,et al.  The attack of the "Holey Shmoos": a case study of advanced DFD and picosecond imaging circuit analysis (PICA) , 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).

[6]  J. Kash,et al.  Dynamic internal testing of CMOS circuits using hot luminescence , 1997, IEEE Electron Device Letters.