Power plane resonances as a source of delta-I noise and the influence of decoupling capacitors

This contribution presents a study of the influence of power planes resonances on the delta-I noise. Noise generated at one point in a system can be transported to a distant point. This phenomenon is studied using the FDTD-technique and a transfer impedance is introduced to quantify the results. To shield sensitive ICs, capacitive decoupling can be used. The influence of such capacitive shielding is discussed. Analytical approximations are given together with more details on the influence of the different parameters.