Extraction of embedded dispersion characteristics
暂无分享,去创建一个
[1] Hiroyuki Ito,et al. A simple through-only de-embedding method for on-wafer S-parameter measurements up to 110 GHz , 2008, IMS 2008.
[2] K. Masu,et al. On the validity of bisection-based thru-only de-embedding , 2010, 2010 International Conference on Microelectronic Test Structures (ICMTS).
[3] B.K. Gilbert,et al. Network analyzer measurement de-embedding utilizing a distributed transmission matrix bisection of a single THRU structure , 2004, ARFTG 63rd Conference, Spring 2004.
[4] G. F. Engen,et al. Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network Analyzer , 1979 .