Evaluation of several semi-theoretical methods for quantitative secondary ion mass spectrometric analysis after discrimination-correction of data

[1]  G. Morrison,et al.  Energy spectra of ions sputtered from elements by O+2: A comprehensive study , 1979 .

[2]  J. D. Fassett,et al.  Computerized image processing for evaluation of sampling error in ion microprobe analysis , 1978 .

[3]  G. Morrison,et al.  Detector discrimination in sims II. Ion-to-electron converter yield factors for negative ions , 1978 .

[4]  G. Morrison,et al.  Quantitative ion probe measurement using matrix ion species ratios , 1978 .

[5]  J. D. Fassett,et al.  Quantitation of secondary ion mass spectrometric images by microphotodensitometry and digital image processing , 1977 .

[6]  G. Scilla,et al.  Sampling error in ion microprobe analysis , 1977 .

[7]  H. Werner,et al.  Quantitative SIMS studies with a uranium matrix , 1977 .

[8]  H. Werner,et al.  Test of a quantitative approach to secondary ion mass spectrometry on glass and silicate standards , 1977 .

[9]  D. Simons,et al.  Evaluation of the local thermal equilibrium model for quantitative secondary ion mass spectrometric analysis , 1976 .

[10]  J. Coles.  Surface ionization — ``Plasma'' in disguise , 1976 .

[11]  H. Werner,et al.  Quantitative analysis of low alloy steels by secondary ion mass spectrometry , 1976 .

[12]  W. Steiger,et al.  On the use of the saha-eggert equation for quantitative sims analysis using argon primary ions , 1976 .

[13]  W. Gries,et al.  A quantitative model for the interpretation of secondary ion mass spectra of dilute alloys , 1975 .

[14]  T. Ishitani,et al.  Quantitative analysis with an ion microanalyzer , 1975 .

[15]  R. Shimizu,et al.  Practicality of the thermodynamic model for quantitative ion probe microanalysis of low alloy steels , 1975 .

[16]  S. P. Bhatia,et al.  Analysis of sulfur-containing gases by gas-solid chromatography on a specially treated Porapak QS column packing , 1975 .

[17]  Z. Jurela.  The application of nonequilibrium surface ionization to the emission of secondary ions , 1973 .

[18]  C. Andersen,et al.  Thermodynamic approach to the quantitative interpretation of sputtered ion mass spectra , 1973 .

[19]  T. Rhodin,et al.  A quantum-mechanical model for the ionization and excitation of atoms during sputtering , 1973 .

[20]  J. M. Schroeer.  Quantitative analysis and the yield of ions in a mass spectrometer with sputter ion source , 1972 .

[21]  R. Bethea,et al.  Gas Chromatographic Analysis of Reactive Gases in Air , 1969 .

[22]  A. E. O'Keeffe,et al.  Primary Standards for Trace Gas Analysis. , 1966 .

[23]  G. Ortman.  Monitoring Methane in Atomosphere with a Flame Ionization Detector. , 1966 .

[24]  G. Dugan.  Automatic Carbon, Hydrogen, Nitrogen, Sulfur Analyzer Ciiemistry of Sulfur Reactions , 1977 .

[25]  C. Andersen.  Progress in analytic methods for the ion microprobe mass analyzer , 1969 .

[26]  V. S. Fomenko,et al.  Handbook of Thermionic Properties , 1966 .