Double-crystal interferometer combined with CBED technique

Silicon (Si) double-crystal interferometers combined with the convergent beam electron diffraction (CBED) technique [1] are investigated. Besides the interference fringes superimposed on the zero order Laue zone (ZOLZ) reflections, ultrafine interference fringes with a period of 3.5 x 10 −2 mrad are observed in the high order Laue zone (HOLZ) reflections. A special structure formed on the edge of the crystal is proposed and used as a double-crystal interferometer. The associated two-dimensional computer simulations of the CBED interference pattern using the many-beam Bloch wave theory are in good agreement with the experimental results