A case study for using dynamic partitioning based solution in volume diagnosis

Diagnosis driven yield analysis (DDY A) has been widely adopted for advanced technology node product yield ramp [1]. However gigantic design size and high pattern count demand intense computation resources to diagnose volume failure data, and the diagnosis throughput becomes the bottleneck for the DDYA flow. This paper presents a case study which uses the fully automated dynamic partitioning based diagnosis solution to dramatically improve the throughput. Experimental results based on real silicon manufactured by a 16nm FinFET technology show more than 3X reduction for memory footprint and more than 4X improvement for runtime, which eliminates the throughput bottleneck.

[1]  Yu Huang,et al.  Distributed dynamic partitioning based diagnosis of scan chain , 2013, 2013 IEEE 31st VLSI Test Symposium (VTS).

[2]  Huawei Li,et al.  nGFSIM : A GPU-based fault simulator for 1-to-n detection and its applications , 2010, 2010 IEEE International Test Conference.

[3]  Wu-Tung Cheng,et al.  Compression mode diagnosis enables high volume monitoring diagnosis flow , 2005, IEEE International Conference on Test, 2005..

[4]  Mark Y. Liu,et al.  A 14nm logic technology featuring 2nd-generation FinFET, air-gapped interconnects, self-aligned double patterning and a 0.0588 µm2 SRAM cell size , 2014, 2014 IEEE International Electron Devices Meeting.

[5]  S.M. Reddy,et al.  Improving Performance of Effect-Cause Diagnosis with Minimal Memory Overhead , 2007, 16th Asian Test Symposium (ATS 2007).

[6]  Wenlong Wei,et al.  Machine learning-based volume diagnosis , 2009, 2009 Design, Automation & Test in Europe Conference & Exhibition.

[7]  Wu-Tung Cheng,et al.  Improved volume diagnosis throughput using dynamic design partitioning , 2012, 2012 IEEE International Test Conference.

[8]  Y. S. Nam,et al.  Si FinFET based 10nm technology with multi Vt gate stack for low power and high performance applications , 2016, 2016 IEEE Symposium on VLSI Technology.

[9]  Sudhakar M. Reddy,et al.  On Using Design Partitioning to Reduce Diagnosis Memory Footprint , 2011, 2011 Asian Test Symposium.