Phase Modulation Microscope MIM-2.1 for Measurements of Surface Microrelief. Results of Measurements

The construction and technical characteristics of the phase interferometric microscope MIM-2.1 are described. With the help of this modulation interferometric microscope, a vertical resolution up to fractions of a nanometer and a lateral resolution up to tens of nanometers are achieved. The results of measurements obtained on samples of different types, such as a column, a step, a flute, and a fragment of a DVD disk, are presented.