X-ray diffraction tomography using interference effects

Abstract When the electromagnetic wave excites more than one electron, the coherent scatter from different electrons gives rise to interference effects. X-rays scattered from a crystalline solid can constructively interfere, producing a diffracted beam at well-defined Bragg angles. The aim of this work is to describe a new imaging method based on the detection of diffracted X-rays. Diffraction patterns of polycrystalline solids (lead, silver and copper) were measured. A selective discrimination of a given element in a scanned specimen can be realized by fixing the Bragg angle which produces an interference peak and then, to carry out the computed tomography in the standard mode. The images obtained show the feasibility of this selective tomography