Time domain dielectric spectroscopy: An advanced measuring system

The new time domain measurement system for dielectric measurements is described. The current model is comprised of an IBM PC‐AT/486, ‘‘TDM‐2,’’ a new time domain measurement system, a set of thermostabilized sample holders, and operation and analysis software. This system is designed for use in the measurement of dielectric parameters of liquid and solid materials over the frequency range 100 kHz–10 GHz. Software consists of programs of registration, accumulation and data collection, Fourier analysis, time domain treatment, analysis software: fast and reliable nonlinear curve fitting programs to determine spectroscopic parameters and correlation analysis in time domain. The system utilizes the difference method of measurement with the registration of primary signals with multiwindow nonuniform sampling. Such a system permits the overlap of a frequency range of five orders in a single measurement.

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