NBTI Mitigation Method by Inputting Random Scan-In Vectors in Standby Time

SUMMARY Negative Bias Temperature Instability (NBTI) is one of the serious concerns for long-term circuit performance degradation. NBTI degrades PMOS transistors under negative bias, whereas they recover once negative bias is removed. In this paper, we propose a mitigation method for NBTI-induced performance degradation that exploits the recovery property by shifting random input sequence through scan paths. With this method, we prevent consecutive stress that causes large degradation. Experimental results reveal that random scan-in vectors successfully mitigate NBTI and the path delay degradation is reduced by 71% in a test case when standby mode occupies 10% of total time. We also confirmed that 8-bit LFSR is capable of random number generation for this purpose with low area and

[1]  M.A. Alam,et al.  Separation method of hole trapping and interface trap generation and their roles in NBTI reaction-diffusion model , 2008, 2008 IEEE International Reliability Physics Symposium.

[2]  Robert P. Dick,et al.  Minimization of NBTI performance degradation using internal node control , 2009, 2009 Design, Automation & Test in Europe Conference & Exhibition.

[3]  Sangwoo Pae,et al.  Frequency and recovery effects in high-κ BTI degradation , 2009, 2009 IEEE International Reliability Physics Symposium.

[4]  Muhammad Ashraful Alam,et al.  A comprehensive model of PMOS NBTI degradation , 2005, Microelectron. Reliab..

[5]  P. Nicollian,et al.  Material dependence of hydrogen diffusion: implications for NBTI degradation , 2005, IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..

[6]  Masanori Hashimoto,et al.  Stress Probability Computation for Estimating NBTI-Induced Delay Degradation , 2011, IEICE Trans. Fundam. Electron. Commun. Comput. Sci..

[7]  Massoud Pedram,et al.  Leakage current reduction in CMOS VLSI circuits by input vector control , 2004, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

[8]  Yu Wang,et al.  On the efficacy of input Vector Control to mitigate NBTI effects and leakage power , 2009, 2009 10th International Symposium on Quality Electronic Design.

[9]  Huawei Li,et al.  M-IVC: Using Multiple Input Vectors to Minimize Aging-Induced Delay , 2009, 2009 Asian Test Symposium.

[10]  Ku He,et al.  Temperature-aware NBTI modeling and the impact of input vector control on performance degradation , 2007, 2007 Design, Automation & Test in Europe Conference & Exhibition.

[11]  Enrico Macii,et al.  NBTI-aware sleep transistor design for reliable power-gating , 2009, GLSVLSI '09.

[12]  Yu Cao,et al.  Predictive Modeling of the NBTI Effect for Reliable Design , 2006, IEEE Custom Integrated Circuits Conference 2006.

[13]  Yu Cao,et al.  Compact Modeling and Simulation of Circuit Reliability for 65-nm CMOS Technology , 2007, IEEE Transactions on Device and Materials Reliability.