Point Defects Interaction with Extended Defects and Impurities and Its Influence on the Si-SiO2 System Properties
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I. Heinmaa | M. Kauk | E. Mellikov | A. Samoson | D. Kropman | T. Kärner | U. Ugaste | U. Abru | A. Medvid
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I. Heinmaa | M. Kauk | E. Mellikov | A. Samoson | D. Kropman | T. Kärner | U. Ugaste | U. Abru | A. Medvid