论文信息 - Composition and thickness control of thin LPE HgCdTe layers using x-ray diffraction - 字舞流文

Composition and thickness control of thin LPE HgCdTe layers using x-ray diffraction

S. Tobin | P. Norton | M. Hutchins

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[2] P. W. Norton,et al. X-ray diffraction characterization of LPE HgCdTe heterojunction photodiode material , 1993 .

[3] C. Viswanathan,et al. Compositional analysis of HgCdTe epitaxial layers using secondary ion mass spectrometry , 1992 .