Trade-off Analysis between gm/ID and fT of nanosheet NMOS Transistors with Different Metal Gate Stack at High Temperature

[1]  A. Veloso,et al.  Analog Figures of Merit of Vertically Stacked Silicon Nanosheets nMOSFETs With Two Different Metal Gates for the Sub-7 nm Technology Node Operating at High Temperatures , 2021, IEEE Transactions on Electron Devices.

[2]  N. Horiguchi,et al.  Low–Frequency Noise in Vertically Stacked Si n–Channel Nanosheet FETs , 2020, IEEE Electron Device Letters.

[3]  H. Mertens,et al.  Scaled, Novel Effective Workfunction Metal Gate Stacks for Advanced Low-VT, Gate-All-Around Vertically Stacked Nanosheet FETs with Reduced Vertical Distance between Sheets , 2019, Extended Abstracts of the 2019 International Conference on Solid State Devices and Materials.

[4]  P. Agopian,et al.  Intrinsic Voltage Gain and Unit-Gain Frequency of Omega-Gate Nanowire SOI MOSFETs , 2019, 2019 34th Symposium on Microelectronics Technology and Devices (SBMicro).

[5]  N. Collaert,et al.  Detailed characterisation of Si Gate-All-Around Nanowire MOSFETs at cryogenic temperatures , 2018 .

[6]  Günhan Dündar,et al.  Inversion coefficient optimization assisted analog circuit sizing tool , 2017, 2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD).

[7]  O. Faynot,et al.  Performance of Omega-Shaped-Gate Silicon Nanowire MOSFET With Diameter Down to 8 nm , 2012, IEEE Electron Device Letters.

[8]  D.M. Binkley,et al.  Tradeoffs and Optimization in Analog CMOS Design , 2008, 2007 14th International Conference on Mixed Design of Integrated Circuits and Systems.

[9]  D. Flandre,et al.  Measurement of threshold voltages of thin-film accumulation-mode PMOS/SOI transistors , 1991, IEEE Electron Device Letters.

[10]  G. Ghibaudo,et al.  Influence of source-drain series resistance on MOSFET field-effect mobility , 1985 .

[11]  O. Faynot,et al.  Back gate influence on transistor efficiency of SOI nMOS Ω-gate nanowire down to 10nm width , 2017, 2017 32nd Symposium on Microelectronics Technology and Devices (SBMicro).