A Simulation Research on Test Point Selection for Analog Electronic Systems on Diagnosis and Prognosis

The selection of test points is one of the key steps for electronic systems on prognostic and health management (PHM). Parameters of reasonable test points can characterize the fault features of electronic systems and provide effective input information for diagnosis and prognosis. In this chapter, an improved method of test point selection for analog electronic systems on diagnosis and prognosis is proposed and a case study is presented. The proposed method includes several steps: (1) fault risk analysis: determine susceptibility areas for the electronic system based on environmental stresses analysis and life analysis; (2) functional simulation analysis: based on the circuit schematic diagram, establish the functional simulation model for the system and list all accessible nodes, then identify the relationship between nodes and faults by using correlation models; (3) fault simulation analysis: Combine with the previous analysis of failure modes and mechanisms and set corresponding faults in the functional simulation software; (4) Comprehensive evaluation and selection: evaluate fault simulation data of each test point, and select appropriate test points for the system. The presented method has the following features: considering the specific product condition and failure mechanisms, focusing on high-risk mechanisms, and basing on fault simulation to revise testability model to make it closer to the real fault situations.