Optical parameters and absorption of copper (II)-azo complexes thin films as optical recording media

Abstract Smooth thin films of three kinds of azo dyes of 2-(5′- tert -butyl-3′-azoxylisoxazole)-1, 3-diketones and their copper (II)-azo complexes were prepared by the spin-coating method. Absorption spectra of the thin films on a glass substrate in the 300–600 nm wavelength region were measured. Optical constants (complex refractive index N = n + ik ) and thickness of the thin films prepared on single-crystal silicon substrate in the 300–600 nm wavelength region were investigated on rotating analyzer–polarizer type of scanning ellipsometer, and dielectric constants e ( e = e 1 + ie 2 ), absorption coefficients α as well as reflectance R of thin films were then calculated. In addition, one of the copper (II)-azo complex thin film prepared on glass substrate with an Ag reflective layer was also studied by atomic force microscopy (AFM) and static optical recording. AFM study shows that the copper (II)-azo complex thin film is very smooth and has a root mean square surface roughness of 1.89 nm. Static optical recording shows that the recording marks on the copper (II)-azo complex thin film are very clear and circular, and the size of the minimal recording marks can reach 200 nm.