An Improved Test Generation Algorithm for PairWise Testing

Pair-wise or two-way interaction testing requires that for a given numbers of input parameters to the system, each possible combination of values for any pair of parameters be covered by at least one test. Empirical results show that pair-wise testing is practical and efficient for various types of software systems [1]. The problem of generating a minimum test set for pair-wise testing is NP-complete [3]. In this paper, we propose a test set generation strategy for pair-wise testing when all parameters can take same values. Our strategy is better than those in [3] and “AETG” [1], in terms of the number of tests.