1 Giga bit SOI DRAM with fully bulk compatible process and body-contacted SOI MOSFET structure
暂无分享,去创建一个
Ji-Woon Yang | Min-Rok Oh | Yo-Hwan Koh | Jae-Beom Park | Dai-Hoon Lee | In-Seok Hwang | Kwang-Myung Rho | Min Huh | Jong-Wook Lee | Won-Chang Lee | Chan-Kwang Park | Yeon-Cheol Heo | Byung-Cheol Lee | Myung-Jun Chung | Hyung-Suk Kim | Kyung-Suk Choi | Won-Chul Lee | Jeong-Kug Lee | Kwang-Ho Ahn | Kyoung-Wook Park | Jeong-Yun Yang | Hyung-Ki Kim
[1] Jerry G. Fossum,et al. A physical charge-based model for non-fully depleted SOI MOSFET's and its use in assessing floating-body effects in SOI CMOS circuits , 1995 .
[2] T. Watanabe,et al. Elimination of bipolar-induced breakdown in fully-depleted SOI MOSFETs , 1992, 1992 International Technical Digest on Electron Devices Meeting.
[3] Kazuya Matsuzawa,et al. Technology trends of silicon-on-insulator-its advantages and problems to be solved , 1994, Proceedings of 1994 IEEE International Electron Devices Meeting.
[4] Myung-Hee Nam,et al. Body-contacted SOI MOSFET structure with fully bulk CMOS compatible layout and process , 1997 .
[5] T. Iwamatsu,et al. CAD-compatible high-speed CMOS/SIMOX gate array using field-shield isolation , 1995 .
[6] Kinam Kim,et al. A high performance 16M DRAM on a thin film SOI , 1995, 1995 Symposium on VLSI Technology. Digest of Technical Papers.
[7] Fukashi Morishita,et al. Leakage mechanism due to floating body and countermeasure on dynamic retention mode of SOI-DRAM , 1995, 1995 Symposium on VLSI Technology. Digest of Technical Papers.
[8] N. M. Kalkhoran,et al. Improvement of breakdown voltage and off-state leakage in Ge-implanted SOI n-MOSFETs , 1993, Proceedings of IEEE International Electron Devices Meeting.
[9] Jerry G. Fossum,et al. Analysis and control of floating-body bipolar effects in fully depleted submicrometer SOI MOSFET's , 1991 .