Extracting precise diagnosis of bridging faults from stuck-at fault information
暂无分享,去创建一个
[1] W. Kent Fuchs,et al. Diagnosis of bridging faults in sequential circuits using adaptive simulation, state storage, and path-tracing , 1997, Proceedings International Test Conference 1997.
[2] John M. Acken,et al. Fault Model Evolution For Diagnosis: Accuracy vs Precision , 1992, 1992 Proceedings of the IEEE Custom Integrated Circuits Conference.
[3] F. Brglez,et al. A neutral netlist of 10 combinational benchmark circuits and a target translator in FORTRAN , 1985 .
[4] Leendert M. Huisman,et al. Diagnosing combinational logic designs using the single location at-a-time (SLAT) paradigm , 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).
[5] Robert C. Aitken. Finding defects with fault models , 1995, Proceedings of 1995 IEEE International Test Conference (ITC).
[6] Siyad C. Ma,et al. A comparison of bridging fault simulation methods , 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).
[7] Tracy Larrabee,et al. Diagnosing realistic bridging faults with single stuck-at information , 1998, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
[8] Sreejit Chakravarty,et al. Voting model based diagnosis of bridging faults in combinational circuits , 1995, Proceedings of the 8th International Conference on VLSI Design.
[9] B. Chess,et al. Diagnosis of realistic bridging faults with single stuck-at information , 1995, Proceedings of IEEE International Conference on Computer Aided Design (ICCAD).
[10] David Bryan,et al. Combinational profiles of sequential benchmark circuits , 1989, IEEE International Symposium on Circuits and Systems,.
[11] S. D. Millman,et al. Accurate modeling and simulation of bridging faults , 1991, Proceedings of the IEEE 1991 Custom Integrated Circuits Conference.
[12] Sarita Thakar,et al. On the generation of test patterns for combinational circuits , 1993 .
[13] W. Kent Fuchs,et al. A deductive technique for diagnosis of bridging faults , 1997, ICCAD 1997.
[14] Kenneth R. Bowden,et al. The Modern Fault Dictionary , 1985, ITC.
[15] Melvin A. Breuer,et al. Digital systems testing and testable design , 1990 .
[16] S.D. Millman,et al. Diagnosing CMOS bridging faults with stuck-at fault dictionaries , 1990, Proceedings. International Test Conference 1990.
[17] Arun Gunda,et al. Failure analysis for full-scan circuits , 1995, Proceedings of 1995 IEEE International Test Conference (ITC).
[18] Sreejit Chakravarty,et al. An Algorithm for Diagnosing Two-Line Bridging Faults in Combinational Circuits , 1993, 30th ACM/IEEE Design Automation Conference.
[19] Wojciech Maly,et al. Physically realistic fault models for analog CMOS neural networks , 1991 .
[20] H. K. Lee,et al. HOPE: an efficient parallel fault simulator , 1992, [1992] Proceedings 29th ACM/IEEE Design Automation Conference.