A Review of Statistical Methods for Quality Improvement and Control in Nanotechnology
暂无分享,去创建一个
[1] Jye-Chyi Lu,et al. Wavelet-based SPC procedure for complicated functional data , 2006 .
[2] P. Christofides,et al. Multivariable predictive control of thin film deposition using a stochastic PDE model , 2005, Proceedings of the 2005, American Control Conference, 2005..
[3] M. Khan,et al. Optimization of a self-nanoemulsified tablet dosage form of Ubiquinone using response surface methodology: effect of formulation ingredients. , 2002, International journal of pharmaceutics.
[4] Michelle L. Pantoya,et al. The effect of size distribution on burn rate in nanocomposite thermites: a probability density function study , 2004 .
[5] Jye-Chyi Lu,et al. A Review of Reliability Research on Nanotechnology , 2007, IEEE Transactions on Reliability.
[6] Martha A. Gallivan,et al. An estimation study for control of a lattice model of thin film deposition , 2005, Comput. Chem. Eng..
[7] T. Honda,et al. Growth mode variations of thin films on nano-faceted substrates , 2000 .
[8] Siddhartha Mukherjee,et al. Design of experiments for synthesizing in situ Ni–SiO2 and Co–SiO2 nanocomposites by non-isothermal reduction treatment , 2003 .
[9] Suk Joo Bae,et al. Defect pattern Recognition in Semiconductor Fabrication using Model-based Clustering and Bayesian Inference , 2007 .
[10] Yan Qi,et al. Markov chains and probabilistic computation-a general framework for multiplexed nanoelectronic systems , 2005, IEEE Transactions on Nanotechnology.
[11] Hamid Garmestani,et al. Two-point probability distribution function analysis of Co-polymer nano-composites , 2005 .
[12] P. Christofides,et al. Dynamics and control of thin film surface microstructure in a complex deposition process , 2005 .
[13] Indranil Nandi,et al. Synergistic effect of PEG-400 and cyclodextrin to enhance solubility of progesterone , 2003, AAPS PharmSciTech.
[14] M. Papila,et al. Effects of electrospinning parameters on polyacrylonitrile nanofiber diameter: An investigation by response surface methodology , 2008 .
[15] M. Meyyappan,et al. Growth of Epitaxial Nanowires at the Junctions of Nanowalls , 2003, Science.
[16] 田口 玄一,et al. Introduction to quality engineering : designing quality into products and processes , 1986 .
[17] Antonios Armaou,et al. Control and optimization of multiscale process systems , 2006, Comput. Chem. Eng..
[18] Tirthankar Dasgupta,et al. Statistical Modeling and Analysis for Robust Synthesis of Nanostructures , 2008 .
[19] Andrzej J. Strojwas,et al. Projection-based performance modeling for inter/intra-die variations , 2005, ICCAD-2005. IEEE/ACM International Conference on Computer-Aided Design, 2005..
[20] Masahiro Ohshima. Control and design problems in material processing—how can process systems engineers contribute to material processing? , 2003 .
[21] Liam Blunt,et al. Third generation wavelet for the extraction of morphological features from micro and nano scalar surfaces , 2004 .
[22] Tung-Hsu Hou,et al. Parameters optimization of a nano-particle wet milling process using the Taguchi method, response surface method and genetic algorithm , 2007 .
[23] Sujit Dey,et al. Double sampling data checking technique: an online testing solution for multisource noise-induced errors on on-chip interconnects and buses , 2004, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
[24] H. Thomas Hahn,et al. Dispersant optimization using design of experiments for SiC/vinyl ester nanocomposites , 2005 .
[25] A. Sikder,et al. Online end point detection in CMP using SPRT of wavelet decomposed sensor data , 2005, IEEE Transactions on Semiconductor Manufacturing.
[26] J Carson Meredith,et al. The use of temperature-composition combinatorial libraries to study the effects of biodegradable polymer blend surfaces on vascular cells. , 2005, Biomaterials.
[27] William R. Rodgers,et al. Extrusion processing of TPO nanocomposites , 2004 .
[28] E. Barkai,et al. Nonergodicity of blinking nanocrystals and other Lévy-walk processes. , 2005, Physical review letters.
[29] Sanjukta Bhanja,et al. Time and space efficient method for accurate computation of error detection probabilities in VLSI circuits , 2005 .
[30] Arun K. Sikder,et al. Wavelet-based identification of delamination defect in CMP (Cu-low k) using nonstationary acoustic emission signal , 2003 .
[31] Peter Z. G. Qian,et al. Bayesian Hierarchical Modeling for Integrating Low-Accuracy and High-Accuracy Experiments , 2008, Technometrics.
[32] Songyan Chen,et al. Normal distribution of confinement energy from a photoluminescence line shape analysis in oxidized porous silicon , 2005 .
[33] C.C. Klepper,et al. H/sub /spl alpha// emission as a feedback control sensor for reactive sputter deposition of nano-structured, diamond-like carbon coatings , 2005, IEEE Transactions on Plasma Science.
[34] M.K. Jeong,et al. Optimal automatic control of multistage production processes , 2005, IEEE Transactions on Semiconductor Manufacturing.
[35] Peter Siemroth,et al. Quality control of ultra-thin and super-hard coatings by laser-acoustics , 2002 .
[36] Christopher A. Bode,et al. Automatic control in microelectronics manufacturing: Practices, challenges, and possibilities , 2000, Autom..
[37] Shuen-Lin Jeng,et al. Accelerated Discrete Degradation Models for Leakage Current of Ultra-Thin Gate Oxides , 2007, IEEE Transactions on Reliability.
[38] Yih-Chieh Pan,et al. Precision-limit positioning of direct drive systems with the existence of friction , 2002 .
[39] Ubonthip Nimmannit,et al. Optimization of polylactic-co-glycolic acid nanoparticles containing itraconazole using 23 factorial design , 2003, AAPS PharmSciTech.
[40] Murti V. Salapaka,et al. High bandwidth nano-positioner: A robust control approach , 2002 .
[41] Tirthankar Dasgupta,et al. Robust Parameter Design for Automatically Controlled Systems and Nanostructure Synthesis , 2007 .
[42] Panagiotis D. Christofides,et al. Estimation and control of surface roughness in thin film growth using kinetic Monte-Carlo models , 2002, Proceedings of the 41st IEEE Conference on Decision and Control, 2002..
[43] G. Binnig,et al. A micromechanical thermal displacement sensor with nanometre resolution , 2005 .
[44] Youping Chen,et al. Multiscale modeling of polycrystalline silicon , 2004 .
[45] E. Del Castillo,et al. Statistical process adjustment: A brief retrospective, current status, and some opportunities for further work , 2006 .
[46] Mihail C. Roco,et al. Nanoscale Science and Engineering: Unifying and Transforming Tools , 2004 .
[47] V. Roshan Joseph,et al. Robust Parameter Design With Feed-Forward Control , 2003, Technometrics.
[48] H. Kim,et al. Optimization of experimental conditions based on the Taguchi robust design for the formation of nano-sized silver particles by chemical reduction method , 2004 .
[49] Stephen A. Campbell,et al. Non-Gaussian 1/f noise as a probe of long-range structural and electronic disorder in amorphous silicon , 2003, SPIE International Symposium on Fluctuations and Noise.
[50] Andrzej Huczko,et al. Induction plasma synthesis of fullerenes and nanotubes using carbon black-nickel particles , 2005 .
[51] Yi Lin,et al. An Efficient Variable Selection Approach for Analyzing Designed Experiments , 2007, Technometrics.
[52] Yu Ding,et al. Bayesian Hierarchical Model for Integrating Multi-resolution Metrology Data∗ , 2007 .
[53] E. Miranda,et al. A new model for the breakdown dynamics of ultra-thin gate oxides based on the stochastic logistic differential equation , 2004, 2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716).
[54] G. Müller,et al. Adjustment of the Band Gap Energies of Biostabilized CdS Nanoparticles by Application of Statistical Design of Experiments , 2004 .
[55] William C. Parr. Introduction to Quality Engineering: Designing Quality Into Products and Processes , 1989 .
[56] Yih-Chieh Pan,et al. Precision-limit positioning of direct drive systems with the existence of friction , 2002 .
[57] W. Ebeling. Stochastic Processes in Physics and Chemistry , 1995 .
[58] Hidetoshi Onodera. Variability: Modeling and Its Impact on Design , 2006, IEICE Trans. Electron..
[59] T. Y. Lin,et al. Surface topographical characterization of silver-plated film on the wedge bondability of leaded IC packages , 2003, Microelectron. Reliab..
[60] Fugee Tsung,et al. Run-to-Run Process Adjustment Using Categorical Observations , 2007 .
[61] Zdeněk P. Bažant,et al. Activation energy based extreme value statistics and size effect in brittle and quasibrittle fracture , 2007 .
[62] Margaret J. Robertson,et al. Design and Analysis of Experiments , 2006, Handbook of statistics.
[63] Thomas E. Seidel,et al. Thin film atomic layer deposition equipment for semiconductor processing , 2002 .
[64] Harriet Black Nembhard,et al. Design Issues and Analysis of Experiments in Nanomanufacturing , 2005 .
[65] H. Kim,et al. Applying the Taguchi method to the optimization for the synthesis of TiO2 nanoparticles by hydrolysis of TEOT in micelles , 2005 .
[66] Kaushik Roy,et al. Fast and accurate estimation of nano-scaled SRAM read failure probability using critical point sampling , 2005, Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005..